Semiconductor material and device characterization
Type doc. :
Livre
Langue :
Anglais
Auteur(s) :
Editeur(s) :
Année d'édition :
1990
Thème :
Electronique
ISBN :
0471511048
Afficher le Résumé
The book explains the physical principles behind electrical, optical, and structural characterization methods, including Hall-effect measurements, C–V and I–V analysis, carrier lifetime measurements, and defect characterization. It provides detailed coverage of MOS devices, bipolar transistors, semiconductor interfaces, and reliability assessment techniques. Emphasis is placed on practical measurement procedures, data interpretation, and the relationship between material properties and device performance. The book is widely used by researchers, engineers, and graduate students working in semiconductor technology, microelectronics, and integrated circuit fabrication.
| N° Bulletin | Date / Année de parution | Titre N° Spécial | Sommaire |
|---|
| N° d'Exemplaire / inventaire | Cote | Localisation | Type de Support | Type de Prêt | Statut | Date de Restitution Prévue | Réservation |
|---|---|---|---|---|---|---|---|
| 133716A96 | 621.381 SCH 19 C1 | BIB-Centrale / Ouvrages | Papier | interne | disponible |
Schroder, D. (1990). Semiconductor material and device characterization . John Wiley &Sons, Inc.;