Plasma synthesis and etching of electronic materials. V38

Type doc. :

Livre

Langue :

Anglais

Editeur(s) :

Année d'édition :

1985

Thème :

Electronique

ISBN :

0931837030
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This study deals with plasma-based methods for the synthesis (deposition or growth) and etching of electronic materials. It highlights the following key points: Plasmas allow fine control over surface chemistry, ionization, and ion energy, which determine the structure and purity of synthesized materials. In etching, reactive plasmas provide strong anisotropy: vertically accelerated ions remove material with high precision, which is essential for creating very fine microstructures. The main trade-offs include the etch rate, material selectivity (for example, etching one material without attacking the mask or underlying layer), uniformity over large areas, and control of surface damage (ionic damage, composition changes, roughness). Plasma diagnostics (spectroscopy, measurement of reactive species density, ion/particle flux) are crucial for optimizing parameters such as plasma configuration, pressure, gas composition, and temperature. The article likely also compares various plasma techniques (RIE, PECVD, high-density plasma, etc.) and describes specific applications to materials such as Si, SiO₂, nitrides, and III–V semiconductors.

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N° Bulletin Date / Année de parution Titre N° Spécial Sommaire
N° d'Exemplaire / inventaire Cote Localisation Type de Support Type de Prêt Statut Date de Restitution Prévue Réservation
111537A92 621.381 MAT 5V38 C1 BIB-Centrale / Ouvrages Papier interne disponible
111612A92 621.381 MAT 5V38 C2 BIB-Centrale / Ouvrages Papier interne disponible
Chang, R. et al. (1985). Plasma synthesis and etching of electronic materials. V38 . Pittsburgh Pa;