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Scanning electron microscopy and X-ray microanalysis

Type doc. :

Livre

Langue :

Anglais

Auteur(s) :

Goldstein, Joseph I
Lyman, Charles E
Lifshin, Eric

Edition :

3e ed.

Editeur(s) :

Springer

Année d'édition :

2007

Sujet(s):
electron beam
structure analysis

Thème :

Electronique

ISBN :

9780306472923
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Afficher le Résumé

The book Scanning Electron Microscopy and X-Ray Microanalysis provides a comprehensive overview of the principles, operation, and applications of scanning electron microscopy (SEM) and X-ray microanalysis (EDS/WDS). It explains the physical principles of electron–matter interactions, the various imaging modes (secondary electrons, backscattered electrons, cathodoluminescence), and the sample preparation techniques for different types of materials. The book also details quantitative and qualitative chemical analysis methods, detector calibration, and the factors affecting measurement accuracy and resolution. Finally, it emphasizes the practical applications of SEM and X-ray microanalysis in materials science, metallurgy, geology, biology, and microelectronics, providing numerous examples and experimental recommendations.

Voir le Sommaire

N° Bulletin Date / Année de parution Titre N° Spécial Sommaire
N° d'Exemplaire / inventaire Cote Localisation Type de Support Type de Prêt Statut Date de Restitution Prévue Réservation
218688A09 621.381 SCA 1 C1 BIB-Centrale / Ouvrages Papier interne disponible
218686A09 621.381 SCA 1 C2 BIB-Centrale / Ouvrages Papier interne disponible
218687A09 621.381 SCA 1 C3 BIB-Centrale / Ouvrages Papier externe disponible
Goldstein, J. et al. (2007). Scanning electron microscopy and X-ray microanalysis (3e ed.) . Springer;