Fundamentals of Modern VLSI Devices

Type doc. :

Livre

Langue :

Anglais

Auteur(s) :

Année d'édition :

1998

Thème :

Electronique

ISBN :

0521540852
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This book examines in detail the basic properties and design, including chip integration, of CMOS and bipolar VLSI devices and discusses the various factors that affect their performance. The authors begin with a thorough review of the relevant aspects of semiconductor physics, and proceed to a description of the design of CMOS and bipolar devices. The optimization of these devices for VLSI applications is also covered. The authors highlight the intricate interdependencies and subtle tradeoffs between those device parameters, such as power consumption and packing density, that affect circuit performance and manufacturability. They also discuss in detail the scaling, and physical limits to the scaling, of CMOS and bipolar devices. The book contains many exercises, and can be used as a textbook for senior undergraduate or first-year graduate courses on microelectronics or VLSI devices. It will also be a valuable reference volume for practicing engineers involved in research and development in the electronics industry.

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N° Bulletin Date / Année de parution Titre N° Spécial Sommaire
N° d'Exemplaire / inventaire Cote Localisation Type de Support Type de Prêt Statut Date de Restitution Prévue Réservation
222123A09 621.381 TAU 1 C1 BIB-Centrale / Ouvrages Papier interne disponible
Taur, Y. & Ning, T. (1998). Fundamentals of Modern VLSI Devices . Cambridge University Press;