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Introduction to analytical electron microscopy

Type doc. :

Livre

Langue :

Anglais

Auteur(s) :

Hren, John J
Goldstein, Joseph I
Joy, David C.

Editeur(s) :

Plenum Press

Année d'édition :

1979

Sujet(s):
image formation
radiation damage

Thème :

Electronique

ISBN :

0306402807
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The book explains the fundamental principles of electron optics, image formation, and electron–matter interactions that form the basis of high-resolution microscopy techniques. It covers a wide range of analytical methods including X-ray microanalysis (EDS/WDS), electron energy loss spectroscopy (EELS), convergent beam electron diffraction, and microdiffraction techniques. Special attention is given to quantitative analysis methods, Monte Carlo simulations, and the interpretation of nanoscale chemical and structural information. The book also explores applications in materials science, solid-state physics, and biological systems, showing how AEM can be used to study defects, interfaces, crystal structures, and electronic properties at atomic resolution. Practical issues such as radiation damage, contamination, and specimen preparation are also discussed. Overall, it is a key reference for understanding how analytical electron microscopy combines imaging and spectroscopy to characterize materials at the nan

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N° Bulletin Date / Année de parution Titre N° Spécial Sommaire
N° d'Exemplaire / inventaire Cote Localisation Type de Support Type de Prêt Statut Date de Restitution Prévue Réservation
808423A86 621.381 HRE 1 C1 BIB-Centrale / Ouvrages Papier interne disponible
Hren, J. et al. (1979). Introduction to analytical electron microscopy . Plenum Press;